Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7062850 | Method of forming electrical interconnects having electromigration-inhibiting segments to a critical length | Eugenia Atakov, Lawrence Bair, John Clement, Bruce Gieseke | 2006-06-20 |
| 6904675 | Method of forming electrical interconnects having electromigration-inhibiting plugs | Eugenia Atakov, Lawrence Bair, John Clement, Bruce Gieseke | 2005-06-14 |
| 6678951 | Method of forming electrical interconnects having electromigration-inhibiting plugs | Eugenia Atakov, Lawrence Bair, John Clement, Bruce Gieseke | 2004-01-20 |
| 6245996 | Electrical interconnect structure having electromigration-inhibiting segments | Eugenia Atakov, Lawrence Bair, John Clement, Bruce Gieseke | 2001-06-12 |
| 6060387 | Transistor fabrication process in which a contact metallization is formed with different silicide thickness over gate interconnect material and transistor source/drain regions | Gregory J. Grula, Bjorn K. A. Zetterlund | 2000-05-09 |
| 5094980 | Method for providing a metal-semiconductor contact | — | 1992-03-10 |