| 8742777 |
Method and system for testing an electric circuit |
Sukeshwar Kannan, Ganesh Srinivasan, Friedrich Taenzler |
2014-06-03 |
| 7991096 |
Data sampling method and apparatus using through-transition counts to reject worst sampling position |
Hoon Choi, Gyudong Kim |
2011-08-02 |
| 7236553 |
Reduced dead-cycle, adaptive phase tracking method and apparatus |
Hoon Choi, Gyudong Kim, Daeyun Shim, Seung Ho Hwang |
2007-06-26 |
| 7158593 |
Combining a clock signal and a data signal |
Gyudong Kim, Ook Kim, Min-Kyu Kim, Seung Ho Hwang |
2007-01-02 |
| 7129719 |
Apparatus for detecting defect in circuit pattern and defect detecting system having the same |
Boo Yang Jung, Seong-young Han |
2006-10-31 |
| 7062004 |
Method and apparatus for adaptive control of PLL loop bandwidth |
Gyudong Kim, Min-Kyu Kim, Ook Kim, Eric A. Lee |
2006-06-13 |
| 6870930 |
Methods and systems for TMDS encryption |
Gyudong Kim, Victor M. Da Costa, David D. Lee, Russel A. Martin, Seung Ho Hwang |
2005-03-22 |
| 6111414 |
System, circuit, and method for testing an interconnect in a multi-chip substrate |
Abijit Chatterjee, Madhavan Swaminathan |
2000-08-29 |