Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10859628 | Power droop measurements using analog-to-digital converter during testing | Bo Yang, Vijay M. Bettada, Matthias Knoth, Toshinari Takayanagi | 2020-12-08 |
| 10026499 | Memory testing system | Dragos F. Botea, Vijay M. Bettada | 2018-07-17 |
| 9892802 | Hardware assisted scheme for testing memories using scan | Bo Yang, Andrew J. Copperhall, Vijay M. Bettada | 2018-02-13 |
| 9519026 | Compressed scan testing techniques | Andrew J. Copperhall, Bo Yang | 2016-12-13 |
| 9514842 | Memory testing system | Dragos F. Botea, Vijay M. Bettada | 2016-12-06 |