Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12216161 | Scan chain analysis using predefined capture signature | Bo Yang, Antonietta Oliva, Michael R. Seningen, Vasu P. Ganti | 2025-02-04 |
| 10859628 | Power droop measurements using analog-to-digital converter during testing | Bibo Li, Bo Yang, Matthias Knoth, Toshinari Takayanagi | 2020-12-08 |
| 10026499 | Memory testing system | Dragos F. Botea, Bibo Li | 2018-07-17 |
| 9892802 | Hardware assisted scheme for testing memories using scan | Bo Yang, Andrew J. Copperhall, Bibo Li | 2018-02-13 |
| 9658634 | Under voltage detection and performance throttling | Brijesh Tripathi, Eric G. Smith, Erik P. Machnicki, Jung Wook Cho, Khaled M. Alashmouny +3 more | 2017-05-23 |
| 9514842 | Memory testing system | Dragos F. Botea, Bibo Li | 2016-12-06 |
| 9234942 | Transition fault testing of source synchronous interface | Anuja Banerjee, Samy R. Makar | 2016-01-12 |