Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10891884 | Test-response comparison circuit and scan data transfer scheme in a DFT architecture for micro LED based display panels | Bo Yang, Xiang Lu, Henry C. Jen, Karthik Manickam, Sagar Nataraj +2 more | 2021-01-12 |
| 9892802 | Hardware assisted scheme for testing memories using scan | Bo Yang, Bibo Li, Vijay M. Bettada | 2018-02-13 |
| 9519026 | Compressed scan testing techniques | Bibo Li, Bo Yang | 2016-12-13 |