Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10891884 | Test-response comparison circuit and scan data transfer scheme in a DFT architecture for micro LED based display panels | Bo Yang, Xiang Lu, Andrew J. Copperhall, Henry C. Jen, Karthik Manickam +2 more | 2021-01-12 |
| 9500706 | Hybrid on-chip clock controller techniques for facilitating at-speed scan testing and scan architecture support | Amit Sanghani, Karthikeyan Natarajan, Bo Yang | 2016-11-22 |