Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9234942 | Transition fault testing of source synchronous interface | Anuja Banerjee, Vijay M. Bettada | 2016-01-12 |
| 8793545 | Apparatus and method for clock glitch detection during at-speed testing | Ravi Ramaswami, Anh-Tuan Hoang | 2014-07-29 |
| 8495443 | Secure register scan bypass | Jianlin Yu, Santiago Fernandez-Gomez | 2013-07-23 |
| 8301947 | Dynamic scan chain grouping | Anuja Banerjee | 2012-10-30 |
| 7263642 | Testing replicated sub-systems in a yield-enhancing chip-test environment using on-chip compare to expected results for parallel scan chains testing critical and repairable sections of each sub-system | Niteen A. Patkar | 2007-08-28 |