Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6964276 | Wafer monitoring system | Yoav Alper | 2005-11-15 |
| 6368182 | Apparatus for optical inspection of wafers during polishing | Eran Dvir, Moshe Finarov, Eli Haimovich, Rony Abaron | 2002-04-09 |
| 6045433 | Apparatus for optical inspection of wafers during polishing | Eran Dvir, Eli Haimovich | 2000-04-04 |