Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6418806 | Model test apparatus and method | Andrew J. Mullender, Brian A. Handley, Michael H. Coney, Peter Ireland | 2002-07-16 |
| 5517147 | Multiple-phase clock signal generator for integrated circuits, comprising PLL, counter, and logic circuits | William Burroughs, Joseph A. Manzella | 1996-05-14 |
| 5213416 | On chip noise tolerant temperature sensing circuit | Richard L. Fussell | 1993-05-25 |