Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10846882 | System and method of dimensional calibration for an analytical microscope | Francis J. Deck, Carla S. Draper, William Robert Keefe | 2020-11-24 |
| 9837242 | Charged particle filter | — | 2017-12-05 |
| 9697984 | Charged particle filter | — | 2017-07-04 |