Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10846882 | System and method of dimensional calibration for an analytical microscope | Francis J. Deck, Alan Ronemus, William Robert Keefe | 2020-11-24 |
| 7359060 | Multi-mode sampling probes | Matthew Ebersole, Jeffrey Hirsch | 2008-04-15 |