Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12019014 | Method and apparatus for determining a force applied to a sample during an optical interrogation technique | Gang Feng, Min Yan, William A. Bayer, Peter Steinberg | 2024-06-25 |
| 10846882 | System and method of dimensional calibration for an analytical microscope | Francis J. Deck, Carla S. Draper, Alan Ronemus | 2020-11-24 |
| 6749376 | Binary machine tool holder | Randolf N. Johnson, Christopher M. Lodermeier, Peter J. Ness, Bradley E. Rowell, Mark A. Shannon +1 more | 2004-06-15 |
| 6421929 | Apparatus and method to measure tapered or conical parts | — | 2002-07-23 |