Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10655949 | Inspecting a multilayer sample | Wojciech Jan Walecki | 2020-05-19 |
| 10168138 | Inspecting a slab of material | Wojciech Jan Walecki | 2019-01-01 |
| 10113860 | Inspecting a multilayer sample | Wojciech Jan Walecki | 2018-10-30 |
| 10036624 | Inspecting a slab of material | Wojciech Jan Walecki | 2018-07-31 |
| 9915564 | Inspecting a slab of material | Wojciech Jan Walecki | 2018-03-13 |
| 6922067 | Determination of minority carrier diffusion length in solid state materials | Phuc Van | 2005-07-26 |