Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10883924 | Metallic gratings and measurement methods thereof | Sam O' Mullane, Brennan Peterson, Nicholas James Keller | 2021-01-05 |
| 7430051 | Methods for characterizing semiconductor material using optical metrology | James M. Price | 2008-09-30 |