Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7952375 | AC coupled parameteric test probe | Benjamin N. Eldridge, Charles A. Miller | 2011-05-31 |
| 7852094 | Sharing resources in a system for testing semiconductor devices | Matthew Chraft, Benjamin N. Eldridge, Roy J. Henson | 2010-12-14 |
| 7821255 | Test system with wireless communications | Igor Y. Khandros, Benjamin N. Eldridge, Charles A. Miller | 2010-10-26 |
| 7675311 | Wireless test system | Igor Y. Khandros, Benjamin N. Eldridge, Charles A. Miller | 2010-03-09 |
| 7659736 | Mechanically reconfigurable vertical tester interface for IC probing | Benjamin N. Eldridge, Barbara Vasquez, Makarand Shinde, Gaetan L. Mathieu | 2010-02-09 |
| 7649366 | Method and apparatus for switching tester resources | Roy J. Henson | 2010-01-19 |
| 7616016 | Probe card assembly and kit | Benjamin N. Eldridge, Igor Y. Khandros | 2009-11-10 |
| 7592821 | Apparatus and method for managing thermally induced motion of a probe card assembly | Benjamin N. Eldridge, Gary W. Grube, Eric D. Hobbs, Gaetan L. Mathieu, Makarand Shinde +2 more | 2009-09-22 |
| 7550842 | Integrated circuit assembly | Igor Y. Khandros, Benjamin N. Eldridge, Charles A. Miller, Gary W. Grube, Gaetan L. Mathieu | 2009-06-23 |
| 7548055 | Testing an electronic device using test data from a plurality of testers | Igor Y. Khandros, Benjamin N. Eldridge, Charles A. Miller | 2009-06-16 |
| 7352196 | Probe card assembly and kit | Igor Y. Khandros, Benjamin N. Eldridge | 2008-04-01 |
| 7285968 | Apparatus and method for managing thermally induced motion of a probe card assembly | Benjamin N. Eldridge, Gary W. Grube, Eric D. Hobbs, Gaetan L. Mathieu, Makarand Shinde +2 more | 2007-10-23 |
| 7230437 | Mechanically reconfigurable vertical tester interface for IC probing | Benjamin N. Eldridge, Barbara Vasquez, Makarand Shinde, Gaetan L. Mathieu | 2007-06-12 |
| 7218094 | Wireless test system | Igor Y. Khandros, Benjamin N. Eldridge, Charles A. Miller | 2007-05-15 |
| 7202687 | Systems and methods for wireless semiconductor device testing | Igor Y. Khandros, Benjamin N. Eldridge, Charles A. Miller | 2007-04-10 |
| 7064566 | Probe card assembly and kit | Igor Y. Khandros, Benjamin N. Eldridge | 2006-06-20 |
| 7061257 | Probe card assembly | Igor Y. Khandros, Benjamin N. Eldridge | 2006-06-13 |
| 6856150 | Probe card with coplanar daughter card | Makarand Shinde | 2005-02-15 |
| 6838893 | Probe card assembly | Igor Y. Khandros, Benjamin N. Eldridge | 2005-01-04 |
| 5867033 | Circuit for testing the operation of a semiconductor device | Paul Torgerson, Roy J. Henson | 1999-02-02 |
| 5646406 | Stroboscopic photometer | Heng-Yang Lin | 1997-07-08 |