Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7536670 | Method for verifying and choosing lithography model | Gokhan Percin, Franz Zach | 2009-05-19 |
| 7444615 | Calibration on wafer sweet spots | Gokhan Percin, Franz Zach, Abdurrahman Sezginer, Chi-Song Horng, Roy Prasad | 2008-10-28 |
| 7392502 | Method for real time monitoring and verifying optical proximity correction model and method | Gokhan Percin, Franz Zach, Koichi Suzuki | 2008-06-24 |
| 7318214 | System and method for reducing patterning variability in integrated circuit manufacturing through mask layout corrections | Roy Prasad, Chi-Song Horng | 2008-01-08 |