Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5927853 | Method for thermal impedance evaluation of packaged semiconductor components | Filip Christiaens, Luc Tielemans, Eric Beyne | 1999-07-27 |
| 5915838 | Method and apparatus for local temperature sensing for use in performing high resolution in-situ parameter measurements | Lambert Stals, Jean Roggen, Ward De Ceuninck | 1999-06-29 |
| 5833365 | Method for local temperature sensing for use in performing high resolution in-situ parameter measurements | Lambert Stals, Jean Roggen, Ward De Ceuninck | 1998-11-10 |
| 5795063 | Method and apparatus for thermal impedance evaluation of packaged semiconductor components | Filip Christiaens, Luc Tielemans, Eric Beyne | 1998-08-18 |
| 5646540 | Apparatus and method for measuring electromagnetic ageing parameter of a circuit element and predicting its values | Lambert Stals, Ward De Ceuninck, Jean Roggen | 1997-07-08 |