FD

Fedor Nikolaevich Dultsev

IV Interuniversitair Micro-Electronica Centrum Vzw: 3 patents #49 of 450Top 15%
Overall (All Time): #1,613,303 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6662631 Method and apparatus for characterization of porous films Mikhail Baklanov, Konstantin Mogilnikov, Karen Maex, Denis Shamiryan 2003-12-16
6435008 Apparatus and method for determining porosity Mikhail Baklanov, Konstantin Mogilnikov, Karen Maex 2002-08-20
6319736 Apparatus and method for determining porosity Mikhail Baklanov, Konstantin Mogilnikov, Karen Maex 2001-11-20