| 12431333 |
Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell |
Indranil De, Jeremy Cheng, Thomas Sokollik, Stephen Lam, Xumin Shen |
2025-09-30 |
| 12020897 |
Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell |
Indranil De, Jeremy Cheng, Thomas Sokollik, Stephen Lam, Xumin Shen |
2024-06-25 |
| 11605526 |
Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell |
Indranil De, Jeremy Cheng, Thomas Sokollik, Stephen Lam, Xumin Shen |
2023-03-14 |
| 11328899 |
Methods for aligning a particle beam and performing a non-contact electrical measurement on a cell using a registration cell |
Indranil De, Jeremy Cheng, Thomas Sokollik, Stephen Lam, Xumin Shen |
2022-05-10 |
| 8821795 |
Combinatorial screening method and apparatus |
Imran Hashim, Sandra G. Malhotra, Ryan Clarke, Sunil Shanker, Yun Wang |
2014-09-02 |
| 8815157 |
Combinatorial screening methods and apparatus |
Imran Hashim, Ryan Clarke, Sandra G. Malhotra, Sunil Shanker, Yun Wang |
2014-08-26 |
| 8768643 |
Method and apparatus for parallel testing of semiconductor devices |
Ryan Clarke |
2014-07-01 |
| 8683420 |
Method and system of improved reliability testing |
Yun Wang, Tony P. Chiang, Ryan Clarke, Chi-I Lang |
2014-03-25 |
| 8575951 |
Method for testing multiple coupons |
Ryan Clarke |
2013-11-05 |
| 8219349 |
Test management system |
Yoshiki Ashizawa, Patrick Ngatchou, Heng-Cheng Pai |
2012-07-10 |