YL

Yuen Tat Lee

IN Intel: 3 patents #10,349 of 30,777Top 35%
Overall (All Time): #1,462,766 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10198333 Test, validation, and debug architecture Mark B. Trobough, Keshavan Tiruvallur, Chinna Prudvi, Christian Iovin, David W. Grawrock +37 more 2019-02-05
9971644 Serial I/O functional tester Suketu U. Bhatt, Lakshminarayana Pappu 2018-05-15
7403027 Apparatuses and methods for outputting signals during self-heat burn-in modes of operation Soon Eng Low, Naveendran Balasingam 2008-07-22