Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 7685485 | Functional failure analysis techniques for programmable integrated circuits | Binh Vo, Wan-Pin Hung, David Huang, Peter Boyle, Qi Richard Chen +4 more | 2010-03-23 | $6,021,000 |
| 7212032 | Method and apparatus for monitoring yield of integrated circuits | Jayabrata Ghosh Dastidar, William Y. Hata | 2007-05-01 | $24,719,000 |