Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7685485 | Functional failure analysis techniques for programmable integrated circuits | Binh Vo, Wan-Pin Hung, David Huang, Peter Boyle, Qi Richard Chen +4 more | 2010-03-23 |
| 7212032 | Method and apparatus for monitoring yield of integrated circuits | Jayabrata Ghosh Dastidar, William Y. Hata | 2007-05-01 |