Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11105854 | System, apparatus and method for inter-die functional testing of an integrated circuit | Lakshminarayana Pappu, Robert P. Adler | 2021-08-31 |
| 9223668 | Method and apparatus to trigger and trace on-chip system fabric transactions within the primary scalable fabric | Robert De Gruijl, Chai ZIV, Michael T. Klinglesmith | 2015-12-29 |