Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7829852 | Device having etched feature with shrinkage carryover | George Chen, Brandon L. Ward, Nancy J. Wheeler, Alan Wong | 2010-11-09 |
| 7514274 | Enhanced uniqueness for pattern recognition | Alan Wong | 2009-04-07 |
| 7285781 | Characterizing resist line shrinkage due to CD-SEM inspection | George Chen, Brandon L. Ward, Nancy J. Wheeler, Alan Wong | 2007-10-23 |
| 7211449 | Enhanced uniqueness for pattern recognition | Alan Wong | 2007-05-01 |