Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5610102 | Method for co-registering semiconductor wafers undergoing work in one or more blind process modules | George J. Gardopee, Joseph P. Prusak, Sherman K. Poultney | 1997-03-11 |
| 5555472 | Method and apparatus for measuring film thickness in multilayer thin film stack by comparison to a reference library of theoretical signatures | Keith Daniell | 1996-09-10 |