Issued Patents All Time
Showing 101–125 of 192 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8546910 | Semiconductor structure and method for manufacturing the same | Haizhou Yin, Huilong Zhu | 2013-10-01 |
| 8546241 | Semiconductor device with stress trench isolation and method for forming the same | Haizhou Yin, Huilong Zhu | 2013-10-01 |
| 8541280 | Semiconductor structure and method for manufacturing the same | Haizhou Yin, Huilong Zhu | 2013-09-24 |
| 8541293 | Method of controlled lateral etching | Huilong Zhu, Haizhou Yin | 2013-09-24 |
| 8524565 | Semiconductor device and method for forming the same | Haizhou Yin, Huilong Zhu | 2013-09-03 |
| 8497197 | Method for manufacturing a high-performance semiconductor structure with a replacement gate process and a stress memorization technique | Huilong Zhu, Haizhou Yin | 2013-07-30 |
| 8492842 | Method for forming retrograded well for MOSFET | Huilong Zhu, Qingqing Liang, Haizhou Yin | 2013-07-23 |
| 8470662 | Semiconductor device and method of manufacturing the same | Huilong Zhu, Haizhou Yin | 2013-06-25 |
| 8466500 | Semiconductor device and method for manufacturing the same | Huilong Zhu, Qingqing Liang, Haizhou Yin | 2013-06-18 |
| 8466013 | Method for manufacturing a semiconductor structure | Haizhou Yin, Huilong Zhu | 2013-06-18 |
| 8450813 | Fin transistor structure and method of fabricating the same | Haizhou Yin, Huilong Zhu | 2013-05-28 |
| 8450775 | Method to control source/drain stressor profiles for stress engineering | Yung Fu Chong, Judson R. Holt | 2013-05-28 |
| 8445973 | Fin transistor structure and method of fabricating the same | Huilong Zhu, Haizhou Yin | 2013-05-21 |
| 8440532 | Structure and method for making metal semiconductor field effect transistor (MOSFET) with isolation last process | Huilong Zhu, Qingqing Liang, Haizhou Yin | 2013-05-14 |
| 8441045 | Semiconductor device and method for manufacturing the same | Huilong Zhu, Qingqing Liang, Haizhou Yin | 2013-05-14 |
| 8441050 | Fin transistor structure and method of fabricating the same | Huilong Zhu, Haizhou Yin | 2013-05-14 |
| 8440558 | Semiconductor device and method of fabricating the same | Haizhou Yin, Huilong Zhu | 2013-05-14 |
| 8426282 | Method for forming semiconductor substrate isolation | Haizhou Yin, Huilong Zhu | 2013-04-23 |
| 8426920 | MOSFET and method for manufacturing the same | Huilong Zhu, Qingqing Liang, Haizhou Yin | 2013-04-23 |
| 8420490 | High-performance semiconductor device and method of manufacturing the same | Haizhou Yin, Huilong Zhu | 2013-04-16 |
| 8420489 | High-performance semiconductor device and method of manufacturing the same | Haizhou Yin, Huilong Zhu | 2013-04-16 |
| 8415621 | Method for line width measurement | Haizhou Yin, Huilong Zhu | 2013-04-09 |
| 8410609 | Semiconductor device having carbon nanotube interconnects contact deposited with different orientation and method for manufacturing the same | Huicai Zhong, Qingqing Liang, Huilong Zhu | 2013-04-02 |
| 8409941 | Semiconductor device and method for manufacturing the same | Haizhou Yin, Huilong Zhu | 2013-04-02 |
| 8399315 | Semiconductor structure and method for manufacturing the same | Haizhou Yin, Huilong Zhu | 2013-03-19 |