Issued Patents All Time
Showing 76–90 of 90 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8685851 | MOS device with memory function and manufacturing method thereof | Wenwu Wang | 2014-04-01 |
| 8686534 | Trench isolation structure and method for forming the same | Huicai Zhong, Qingqing Liang | 2014-04-01 |
| 8647987 | Method for improving uniformity of chemical-mechanical planarization process | Tao Yang, Junfeng Li | 2014-02-11 |
| 8642433 | Method for manufacturing semiconductor device | Huicai Zhong, Jun Luo, Qingqing Liang | 2014-02-04 |
| 8575019 | Metal interconnection structure and method for forming metal interlayer via and metal interconnection line | — | 2013-11-05 |
| 8557677 | Stack-type semiconductor device and method for manufacturing the same | Qingqing Liang, Huicai Zhong, Huilong Zhu | 2013-10-15 |
| 8541296 | Method of manufacturing dummy gates in gate last process | Tao Yang, Jiang Yan, Junfeng Li, Yihong Claire Lu, Dapeng Chen | 2013-09-24 |
| 8536053 | Method for restricting lateral encroachment of metal silicide into channel region | Jun Luo, Huicai Zhong | 2013-09-17 |
| 8501500 | Method for monitoring the removal of polysilicon pseudo gates | Tao Yang, Junfeng Li, Jiang Yan, Dapeng Chen | 2013-08-06 |
| 8486805 | Through-silicon via and method for forming the same | Dapeng Chen, Wen Ou | 2013-07-16 |
| 8455323 | Method for manufacturing semiconductor wafer | Huicai Zhong, Qingqing Liang | 2013-06-04 |
| 8420492 | MOS transistor and method for forming the same | Huicai Zhong, Qingqing Liang, Da Yang | 2013-04-16 |
| 8409986 | Method for improving within die uniformity of metal plug chemical mechanical planarization process in gate last route | Tao Yang, Junfong Li | 2013-04-02 |
| 8252689 | Chemical-mechanical planarization method and method for fabricating metal gate in gate-last process | Tao Yang, Jinbiao Liu, Xiaobin He, Dapeng Chen | 2012-08-28 |
| 7183604 | High dielectric constant device | Eduard A. Cartier, Jerry Chen | 2007-02-27 |