Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7785935 | Manufacturing method for forming an integrated circuit device and corresponding integrated circuit device | Ole Bosholm, Marco Lepper, Goetz Springer, Detlef Weber, Grit Bonsdorf | 2010-08-31 |
| 7212019 | Probe needle for testing semiconductor chips and method for producing said probe needle | Manfred Schneegans | 2007-05-01 |
| 6784678 | Test apparatus for semiconductor circuit and method of testing semiconductor circuits | — | 2004-08-31 |