Issued Patents All Time
Showing 26–28 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7319625 | Built-in memory current test circuit | Yeong-Jar Chang, Jung-Chi Ho, Cheng-Wen Wu, Chin-Jung Su | 2008-01-15 |
| 7228468 | Method and apparatus of build-in self-diagnosis and repair in a memory with syndrome identification | Cheng-Wen Wu, Rei-Fu Huang, Chin-Lung Su, Wen-Ching Wu, Yeong-Jar Chang +1 more | 2007-06-05 |
| 6937106 | Built-in jitter measurement circuit for voltage controlled oscillator and phase locked loop | Yeong-Jar Chang, Shen Lin, Wen-Ching Wu | 2005-08-30 |