CL

Chun-Wei Lo

IT ITRI: 6 patents #1,152 of 9,619Top 15%
FT Faraday Technology: 1 patents #194 of 417Top 50%
Overall (All Time): #600,082 of 4,157,543Top 15%
8
Patents All Time

Issued Patents All Time

Showing 1–8 of 8 patents

Patent #TitleCo-InventorsDate
12270638 Measurement system and measurement method Hsiang-Chun Wei, Chung-Lun Kuo, Chih-Hsiang Liu 2025-04-08
12099053 Method of training AI for label-free cell viability determination and label-free cell viability determination method by trained AI Hsiang-Chun Wei, Chih-Hsiang Liu, Chung-Lun Kuo, Chia-Hung Cho, Wei-Hsiung Tsai 2024-09-24
12007221 Heterogeneous integration detecting method and heterogeneous integration detecting apparatus Hsiang-Chun Wei, Chih-Hsiang Liu, Yi-Sha Ku, Chung-Lun Kuo, Chieh-Yi Lo 2024-06-11
11507020 Optical measurement system for obtaining and analyzing surface topography of object Hsiang-Chun Wei, Chung-Lun Kuo, Chia-Hung Cho, Chih-Hsiang Liu 2022-11-22
10094774 Scattering measurement system and method Chia-Liang Yeh, Yi-Chang Chen, Yi-Sha Ku 2018-10-09
9752866 Measurement system Hsiang-Chun Wei, Yi-Sha Ku, Chia-Hung Cho, Chieh-Yu Wu, Chih-Hsiang Liu 2017-09-05
7555737 Auxiliary method for circuit design Hsien Ming Liu, Chien-Jung Hsin, Jun-Jyeh Hsiao, Sheng Chun Lee 2009-06-30
7096441 Method for generating a command file of a group of DRC rules and/or a command file of a group of LVS/LPE rules Szu-Sheng Kang, Chien-Yi Ku, Chien-Tsung Chen 2006-08-22