Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12354290 | Sample depth-measuring device and method | Yi-Sha Ku, Cheng-Kang Lee | 2025-07-08 |
| 12099053 | Method of training AI for label-free cell viability determination and label-free cell viability determination method by trained AI | Hsiang-Chun Wei, Chih-Hsiang Liu, Chung-Lun Kuo, Chun-Wei Lo, Wei-Hsiung Tsai | 2024-09-24 |
| 11507020 | Optical measurement system for obtaining and analyzing surface topography of object | Hsiang-Chun Wei, Chung-Lun Kuo, Chun-Wei Lo, Chih-Hsiang Liu | 2022-11-22 |
| 11248903 | Three-dimension measurement device and operation method thereof | Po-Yi Chang, Yi-Sha Ku, Kai-Ping Chuang, Chih-Hsiang Liu, Fu-Cheng Yang | 2022-02-15 |
| 10429318 | Detection system for a multilayer film and method thereof using dual image capture devices for capturing forward scattered light and back scattered light | Ding-Kun Liu | 2019-10-01 |
| 10105906 | Structured light generating device and measuring system and method | Hsin-Yi Chen, Yi-Chen Hsieh, Cheng-Ta Mu | 2018-10-23 |
| 10002439 | Three-dimensional measurement system and method thereof | Po-Yi Chang | 2018-06-19 |
| 9970754 | Surface measurement device and method thereof | Kai-Ping Chuang, Yi-Wei Chang | 2018-05-15 |
| 9835449 | Surface measuring device and method thereof | Kai-Ping Chuang, Ming-Cheng Tsai | 2017-12-05 |
| 9752866 | Measurement system | Hsiang-Chun Wei, Yi-Sha Ku, Chieh-Yu Wu, Chun-Wei Lo, Chih-Hsiang Liu | 2017-09-05 |
| 9533375 | Temperature sensing apparatus, laser processing system, and temperature measuring method | Yi-Chen Hsieh, Kai-Ping Chuang, Sen-Yih Chou, Chun-Jen Lin | 2017-01-03 |
| 8912483 | Display measuring device | Yu-Shan Chang, Sen-Yih Chou | 2014-12-16 |
| 8581979 | System and method for constructing high resolution images | Sen-Yih Chou | 2013-11-12 |