Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11257657 | Charged particle beam device with interferometer for height measurement | John Breuer, Rony Reuveni | 2022-02-22 |
| 5644132 | System for high resolution imaging and measurement of topographic and material features on a specimen | Alon Litman, Steven R. Rogers | 1997-07-01 |
| 5466940 | Electron detector with high backscattered electron acceptance for particle beam apparatus | Alon Litman, Steven R. Rogers | 1995-11-14 |