Issued Patents All Time
Showing 26–36 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9299623 | Run-to-run control utilizing virtual metrology in semiconductor manufacturing | Robert J. Baseman, Jingrui He, Emmanuel Yashchin | 2016-03-29 |
| 9262255 | Multi-stage failure analysis and prediction | Arun Hampapur, Hongfei Li, Zhiguo Li | 2016-02-16 |
| 9240360 | Run-to-run control utilizing virtual metrology in semiconductor manufacturing | Robert J. Baseman, Jingrui He, Emmanuel Yashchin | 2016-01-19 |
| 9176183 | Method and system for wafer quality predictive modeling based on multi-source information with heterogeneous relatedness | Jingrui He, Robert J. Baseman | 2015-11-03 |
| 9058569 | System and method for maintenance planning and failure prediction for equipment subject to periodic failure risk | Jonathan R. M. Hosking, Jayant R. Kalagnanam | 2015-06-16 |
| 9058568 | System and method for maintenance planning and failure prediction for equipment subject to periodic failure risk | Jonathan R. M. Hosking, Jayant R. Kalagnanam | 2015-06-16 |
| 8887008 | Maintenance planning and failure prediction from data observed within a time window | Jonathan R. M. Hosking, Emmanuel Yashchin | 2014-11-11 |
| 8880962 | Maintenance planning and failure prediction from data observed within a time window | Jonathan R. M. Hosking, Emmanuel Yashchin | 2014-11-04 |
| 8799042 | Distribution network maintenance planning | Arun Hampapur, Jayant R. Kalagnanam, Emmanuel Yashchin | 2014-08-05 |
| 8732627 | Method and apparatus for hierarchical wafer quality predictive modeling | Robert J. Baseman, Jingrui He | 2014-05-20 |
| 8670782 | Systems and methods for analyzing spatiotemporally ambiguous events | Arun Hampapur, Bert Huang, Lexing Xie | 2014-03-11 |