Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7308621 | Testing of ECC memories | R. Dean Adams, Gerard M. Salem | 2007-12-11 |
| 7149941 | Optimized ECC/redundancy fault recovery | R. Dean Adams, Gerard M. Salem | 2006-12-12 |
| 6643807 | Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of large embedded arrays in manufacturing test | Jay G. Heaslip, Gary W. Maier, Gerard M. Salem | 2003-11-04 |