Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6937965 | Statistical guardband methodology | Mark R. Bilak, Joseph M. Forbes, Curt Guenther, Michael J. Maloney, Michael D. Maurice +2 more | 2005-08-30 |
| 5634001 | Method to calculate hot-electron test voltage differential for assessing microprocessor reliability | Steven W. Mittl, David E. Moran, Kimball M. Watson | 1997-05-27 |
| 5533197 | Method to assess electromigration and hot electron reliability for microprocessors | David E. Moran, Kimball M. Watson | 1996-07-02 |