David E. Moran — 11 Patents at IBM

David E. Moran has been granted 11 US patents while listed as an inventor at IBM. The first was granted in 1996 and the most recent in April 2010. David E. Moran ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list David E. Moran in South Burlington, VT, US.

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
7698709	Method and apparatus to manage multi-computer supply based on an economic model	Gary S. Ditlow, Daria R. Dooling, Thomas Wood Wilkins, Ralph J. Williams	2010-04-13	$5,309,000
7653907	Method and apparatus to manage multi-computer supply using a model based on an economic model of supply and cost of supply	Gary S. Ditlow, Daria R. Dooling, Thomas Wood Wilkins, Ralph J. Williams	2010-01-26	$13,842,000
7315305	Method for visualizing data	Cassondra L. Crotty, Daria R. Dooling, Ralph J. Williams	2008-01-01
7305674	Method and apparatus to manage multi-computer supply	Gary S. Ditlow, Daria R. Dooling, Thomas Wood Wilkins, Ralph J. Williams	2007-12-04	$7,765,000
7136798	Method and apparatus to manage multi-computer demand	Gary S. Ditlow, Daria R. Dooling, Stephen D. Thomas, Ralph J. Williams	2006-11-14	$5,090,000
6788302	Partitioning and load balancing graphical shape data for parallel applications	Gary S. Ditlow, Daria R. Dooling, Ralph J. Williams	2004-09-07	$9,920,000
6601025	Method to partition the physical design of an integrated circuit for electrical simulation	Gary S. Ditlow, Daria R. Dooling, Richard L. Moore, Thomas Wood Wilkins, Ralph J. Williams	2003-07-29	$10,466,000
6301690	Method to improve integrated circuit defect limited yield	Gary S. Ditlow, Daria R. Dooling, Richard L. Moore, Gustavo E. Tellez, Ralph J. Williams +1 more	2001-10-09	$29,916,000
5878424	Method and apparatus for indexing patterned sparse arrays for microprocessor data cache	Daria R. Dooling, Lenore Marie Restifo Mullin	1999-03-02	$11,544,000
5634001	Method to calculate hot-electron test voltage differential for assessing microprocessor reliability	Steven W. Mittl, Timothy J. O'Gorman, Kimball M. Watson	1997-05-27	$12,508,000
5533197	Method to assess electromigration and hot electron reliability for microprocessors	Timothy J. O'Gorman, Kimball M. Watson	1996-07-02	$7,228,000

David E. Moran — 11 Patents

Issued Patents All Time

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