Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8776006 | Delay defect testing of power drop effects in integrated circuits | Raghu G. GopalaKrishnaSetty, Balaji Upputuri | 2014-07-08 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8776006 | Delay defect testing of power drop effects in integrated circuits | Raghu G. GopalaKrishnaSetty, Balaji Upputuri | 2014-07-08 |