Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 5325180 | Apparatus for identifying and distinguishing temperature and system induced measuring errors | Edward W. Conrad | 1994-06-28 | $10,968,000 |
| 4757207 | Measurement of registration of overlaid test patterns by the use of reflected light | Lawrence P. Hayes, deceased | 1988-07-12 | $23,735,000 |