Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7512518 | Method for measuring thin layers in solid state devices | Alexandre Blander, Carl Savard, Julien Sylvestre | 2009-03-31 |
RB
Richard Brassard
Overall (All Time): #3,321,568 of 4,157,543Top 80%
1
Patents All Time