Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
RF

Randall M. Feenstra

IBM: 2 patents #32,839 of 70,183Top 50%
Tarrytown, NY: #214 of 403 inventorsTop 55%
New York: #48,759 of 115,490 inventorsTop 45%
Overall (All Time): #2,296,230 of 4,157,543Top 60%
2 Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
5337015 In-situ endpoint detection method and apparatus for chemical-mechanical polishing using low amplitude input voltage Naftali E. Lustig, William L. Guthrie 1994-08-09
4550257 Narrow line width pattern fabrication Gerd Binnig, Rodney T. Hodgson, Heinrich Rohrer, Jerry M. Woodall 1985-10-29