Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11977524 | Machine learning system for automated attribute name mapping between source data models and destination data models | Lakshminarasimhan Sundararajan | 2024-05-07 |
| 11556508 | Machine learning system for automated attribute name mapping between source data models and destination data models | Lakshminarasimhan Sundararajan | 2023-01-17 |
| 4504784 | Method of electrically testing a packaging structure having N interconnected integrated circuit chips | Maurice T. McMahon | 1985-03-12 |
| 4494066 | Method of electrically testing a packaging structure having n interconnected integrated circuit chips | Maurice T. McMahon | 1985-01-15 |
| 4293919 | Level sensitive scan design (LSSD) system | Sumit DasGupta, Thomas W. Williams | 1981-10-06 |
| 4204633 | Logic chip test system with path oriented decision making test pattern generator | — | 1980-05-27 |