Issued Patents All Time
Showing 26–30 of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7456636 | Test structures and method of defect detection using voltage contrast inspection | Huilong Zhu | 2008-11-25 |
| 7397556 | Method, apparatus, and computer program product for optimizing inspection recipes using programmed defects | MaryJane Brodsky, Kourosh Nafisi | 2008-07-08 |
| 7074628 | Test structure and method for yield improvement of double poly bipolar device | Bradley Albers, Thomas Craig Esry, Daniel Charles Kerr, Edward P. Martin, Jr. | 2006-07-11 |
| 6906538 | Alternating pulse dual-beam apparatus, methods and systems for voltage contrast behavior assessment of microcircuits | Michael Scott Twiford | 2005-06-14 |
| 5461559 | Hierarchical control system for molecular beam epitaxy | Jeffrey J. Heyob, Steven R. LeClair, T. Walter Haas, Kenneth Currie, Doug Moore +2 more | 1995-10-24 |