Issued Patents All Time
Showing 26–44 of 44 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9366723 | Test coverage of integrated circuits with masking pattern selection | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2016-06-14 |
| 9201117 | Managing redundancy repair using boundary scans | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2015-12-01 |
| 9188636 | Self evaluation of system on a chip with multiple cores | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2015-11-17 |
| 9116205 | Test coverage of integrated circuits with test vector input spreading | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2015-08-25 |
| 9103879 | Test coverage of integrated circuits with test vector input spreading | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2015-08-11 |
| 9069041 | Self evaluation of system on a chip with multiple cores | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2015-06-30 |
| 9032256 | Multi-core processor comparison encoding | Steven M. Douskey, Ryan A. Fitch, Dennis Martin Rickert | 2015-05-12 |
| 9003244 | Dynamic built-in self-test system | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2015-04-07 |
| 8898530 | Dynamic built-in self-test system | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2014-11-25 |
| 8856720 | Test coverage of integrated circuits with masking pattern selection | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2014-10-07 |
| 8762803 | Implementing enhanced pseudo random pattern generators with hierarchical linear feedback shift registers (LFSRs) | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2014-06-24 |
| 8667431 | Test coverage of integrated circuits with masking pattern selection | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2014-03-04 |
| 8627162 | Iimplementing enhanced aperture function calibration for logic built in self test (LBIST) | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2014-01-07 |
| 8516318 | Dynamic scan | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2013-08-20 |
| 8407542 | Implementing switching factor reduction in LBIST | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2013-03-26 |
| 7949918 | Asynchronous communication using standard boundary architecture cells | Steven M. Douskey, Brandon E. Schenck | 2011-05-24 |
| 7890824 | Asynchronous communication apparatus using JTAG test data registers | Steven M. Douskey, Brandon E. Schenck | 2011-02-15 |
| 7514947 | Method of and system for functionally testing multiple devices in parallel in a burn-in-environment | Jason T. Albert, William T. Bronk, Timothy J. Eby, Norman K. James | 2009-04-07 |
| 7114109 | Method and apparatus for customizing and monitoring multiple interfaces and implementing enhanced fault tolerance and isolation features | James Fred Daily, Steven M. Douskey | 2006-09-26 |