Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8006153 | Multiple uses for BIST test latches | Steven R. Ferguson, Garrett Stephen Koch, Osamu Takahashi | 2011-08-23 |
| 7574642 | Multiple uses for BIST test latches | Steven R. Ferguson, Garrett Stephen Koch, Osamu Takahashi | 2009-08-11 |
| 7318182 | Memory array manufacturing defect detection system and method | Louis Bernard Bushard, Sang Hoo Dhong, Brian Flachs, Osamu Takahashi | 2008-01-08 |