Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7676775 | Method to determine the root causes of failure patterns by using spatial correlation of tester data | Howard H. Chen, Fook-Luen Heng, Louis C. Hsu, Xu Ouyang | 2010-03-09 |