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John Joseph Salazar

IBM: 10 patents #10,888 of 70,183Top 20%
TI Trend Micro Incorporated: 1 patents #304 of 749Top 45%
Overall (All Time): #458,548 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
9916480 Security apparatus to house a device Paul A. Tucker 2018-03-13
7479796 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Dales Morrison Kent, Kenneth Carl Larsen, Howard Victor Mahaney, Jr. +1 more 2009-01-20
7466155 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Dales Morrison Kent, Kenneth Carl Larsen, Howard Victor Mahaney, Jr. +1 more 2008-12-16
7463017 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Dales Morrison Kent, Kenneth Carl Larsen, Howard Victor Mahaney, Jr. +1 more 2008-12-09
7456644 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Dales Morrison Kent, Kenneth Carl Larsen, Howard Victor Mahaney, Jr. +1 more 2008-11-25
7453279 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Dales Morrison Kent, Kenneth Carl Larsen, Howard Victor Mahaney, Jr. +1 more 2008-11-18
7425822 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Dales Morrison Kent, Kenneth Carl Larsen, Howard Victor Mahaney, Jr. +1 more 2008-09-16
7423440 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Dales Morrison Kent, Kenneth Carl Larsen, Howard Victor Mahaney, Jr. +1 more 2008-09-09
7405583 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Dales Morrison Kent, Kenneth Carl Larsen, Howard Victor Mahaney, Jr. +1 more 2008-07-29
7352200 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Dales Morrison Kent, Kenneth Carl Larsen, Howard Victor Mahaney, Jr. +1 more 2008-04-01
6911836 Apparatus for functional and stress testing of exposed chip land grid array devices Lonnie J. Cannon, John Saunders Corbin, Jr., David L. Gardell, Jose Arturo Garza, Jr., Jeffrey Frank Kutner +2 more 2005-06-28