| 9854690 |
3U “T” shaped chassis design with rail features |
Gordon A. Frye, Ralph C. Frangioso, Jr., Robert P. Wierzbicki, Keith C. Johnson |
2017-12-26 |
| 9801279 |
Configurable system board |
Ralph C. Frangioso, Jr., Joseph P. King, Jr., Stephen E. Strickland, David C. Bisbee |
2017-10-24 |
| 9545006 |
Configurable system board |
Ralph C. Frangioso, Jr., Joseph P. King, Jr., Stephen E. Strickland, David C. Bisbee |
2017-01-10 |
| 7026806 |
Apparatus for preventing cross talk and interference in semiconductor devices during test |
Gene T. Patrick, Kevin M. Potasiewicz |
2006-04-11 |
| 6921288 |
Semiconductor test and burn-in apparatus provided with a high current power connector for combining power planes |
Gene T. Patrick |
2005-07-26 |
| 6176374 |
Component carrier having a wave pattern tension reduction surface |
Jeffrey Jay Jones, David J. Rich, Woody Smith |
2001-01-23 |
| 6171873 |
Method and apparatus for preventing chip breakage during semiconductor manufacturing using wafer grinding striation information |
Ronald L. Mendelson, Robert F. Cook, David Frederick Diefenderfer, Eric G. Liniger, Donald W. Brouillette |
2001-01-09 |
| 5888838 |
Method and apparatus for preventing chip breakage during semiconductor manufacturing using wafer grinding striation information |
Ronald L. Mendelson, Robert F. Cook, David Frederick Diefenderfer, Eric G. Liniger, Donald W. Brouillette |
1999-03-30 |
