Eduard A. Cartier

IBM: 94 patents #629 of 70,183Top 1%

Globalfoundries: 11 patents #330 of 4,424Top 8%

TL Tokyo Electron Limited: 3 patents #2,069 of 5,567Top 40%

IV Interuniversitair Micro-Electronica Centrum Vzw: 1 patents #167 of 450Top 40%

GU Globalfoundries U.S.: 1 patents #22 of 211Top 15%

📍 New York, NY: #56 of 20,192 inventorsTop 1%

🗺 New York: #534 of 115,490 inventorsTop 1%

Overall (All Time): #14,124 of 4,157,543Top 1%

101

Patents All Time

Issued Patents All Time

Showing 101–101 of 101 patents

Patent #	Title	Co-Inventors	Date
6326732	Apparatus and method for non-contact stress evaluation of wafer gate dielectric reliability	Wagdi W. Abadeer, James H. Stathis	2001-12-04