CA

Conrad M. Albrecht

IBM: 17 patents #6,502 of 70,183Top 10%
Overall (All Time): #266,720 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11874415 Earthquake detection and response via distributed visual input Carlo Siebenschuh, Johannes Walter Schmude, Hendrik F. Hamann, Siyuan Lu, Oki Gunawan 2024-01-16
11861780 Point cloud data management using key value pairs for class based rasterized layers Hendrik F. Hamann, Carlo Siebenschuh, Siyuan Lu 2024-01-02
11594004 Distributed vector-raster fusion Ildar Khabibrakhmanov, Sharathchandra U. Pankanti, Levente Klein, Wang-Long Zhou, Bruce G. Elmegreen +3 more 2023-02-28
11557053 Deep learning to correct map and image features Rui Zhang, Siyuan Lu, Wei Zhang, Ulrich A. Finkler, David S. Kung +2 more 2023-01-17
11527062 Method and system for crop recognition and boundary delineation Siyuan Lu, Fernando J. Marianno, Hendrik F. Hamann, Marcus O. Freitag, Levente Klein 2022-12-13
11514630 Scalable visual analytics for remote sensing applications Marcus O. Freitag, Sharathchandra U. Pankanti, Siyuan Lu, Hendrik F. Hamann 2022-11-29
11436712 Predicting and correcting vegetation state Hendrik F. Hamann, Levente Klein, Siyuan Lu, Sharathchandra U. Pankanti, Wang-Long Zhou 2022-09-06
11360970 Efficient querying using overview layers of geospatial-temporal data in a data analytics platform Marcus O. Freitag, Fernando J. Marianno, Siyuan Lu, Hendrik F. Hamann, Johannes Walter Schmude 2022-06-14
11210268 Scalable space-time density data fusion Marcus O. Freitag, Hendrik F. Hamann 2021-12-28
11204896 Scalable space-time density data fusion Marcus O. Freitag, Hendrik F. Hamann 2021-12-21
11164310 Method and system for crop recognition and boundary delineation Hendrik F. Hamann, Levente Klein, Siyuan Lu, Fernando J. Marianno 2021-11-02
10839264 Scalable feature classification for laser scanning data and digital elevation models Sharathchandra U. Pankanti, Marcus O. Freitag, Hendrik F. Hamann 2020-11-17
10706080 Event clustering and event series characterization based on expected frequency Marcus O. Freitag, Theodore G. van Kessel, Siyuan Lu, Hendrik F. Hamann 2020-07-07
10664702 Method and system for crop recognition and boundary delineation Siyuan Lu, Fernando J. Marianno, Hendrik F. Hamann, Marcus O. Freitag, Levente Klein 2020-05-26
10572976 Enhancing observation resolution using continuous learning Hendrik F. Hamann, Siyuan Lu, Sharathchandra U. Pankanti 2020-02-25
10445877 Method and system for crop recognition and boundary delineation Hendrik F. Hamann, Levente Klein, Siyuan Lu, Fernando J. Marianno 2019-10-15
10410091 Detecting artifacts based on digital signatures Marcus O. Freitag, Hendrik F. Hamann, Sharathchandra U. Pankanti 2019-09-10