CO

Chiaki Oishi

IBM: 10 patents #10,888 of 70,183Top 20%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
Overall (All Time): #446,196 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
11619576 Corrosive substance detection using hydrophilic gel for improved corrosion exposure detection in electronic devices Satsuo Kiyono, Eric V. Kline, Carlo Gonzales Gagui, Wen Ming Lim 2023-04-04
11550947 Automatic prohibition of personal information identification Satsuo Kiyono, Eric V. Kline, Wen Ming Lim, Carlo Gonzales Gagui 2023-01-10
11183274 Analysis of answers to questions Yoshio Horiuchi, Katsuhiko Hagiwara, Yuji Sugiyama, Jiayun Zhu, Junichi Sugimoto 2021-11-23
11151420 Determination using learned model Yutaka Oishi, Shuji Umehara, Takuya Goto, Masaki Saitoh 2021-10-19
11030493 Estimating sequential blood-sugar levels using images of meals Takuya Goto, Yutaka Oishi, Shuji Umehara, Masaki Saitoh 2021-06-08
10949614 Dynamically changing words based on a distance between a first area and a second area Katsuhiko Hagiwara, Yoshio Horiuchi, Junichi Sugimoto, Yuji Sugiyama, Jiayun Zhu 2021-03-16
10831561 Method for changing allocation of data using synchronization token Katsuhiko Hagiwara, Junichi Kato, Kumiko Maeda, Yuriko Nishikawa, Yutaka Oishi +1 more 2020-11-10
10394620 Method for changing allocation of data using synchronization token Katsuhiko Hagiwara, Junichi Kato, Kumiko Maeda, Yuriko Nishikawa, Yutaka Oishi +1 more 2019-08-27
9436891 Discriminating synonymous expressions using images Tetsuya Nasukawa, Shoko Suzuki 2016-09-06
7525651 Inspection apparatus and inspection method for pattern profile, and exposure apparatus Mitsuru Uda, Kazunari Terakawa, Akira Susuki, Yasuharu Yamada, Teruhiko Havano 2009-04-28
7310141 Inspection device and inspection method for pattern profile, exposure system Mitsuru Uda, Kazunari Terakawa, Akira Suzuki, Yasuharu Yamada, Teruhiko Hayano 2007-12-18