Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7525651 | Inspection apparatus and inspection method for pattern profile, and exposure apparatus | Mitsuru Uda, Kazunari Terakawa, Chiaki Oishi, Yasuharu Yamada, Teruhiko Havano | 2009-04-28 |
AS
Akira Susuki
Overall (All Time): #3,324,009 of 4,157,543Top 80%
1
Patents All Time